The Measurement of Engineered Nanoparticles
[28 Sep 2005]
National Physical Laboratory, Teddington, Middlesex, United Kingdom
Conference Aims and
Objectives
The aim of the conference is to review the measurement
techniques used in the manufacture and use of engineered
nanoparticles and to identify key measurement related
issues that need to be addressed to enable this area
of nanotechnology to be exploited to the benefit of
the UK economy.
The conference will
focus on the measurement of size, size distribution
and surface area of engineered nanoparticles in the
sub 100nm size range. It will review and compare the
capabilities and applications of particle characterisation
techniques and discuss the measurement and standardisation
requirements and issues in nanoparticle manufacturing
processes and in incorporating nanoparticles in products.
Who should attend
This conference is aimed at scientists, engineers
and managers, involved in research, manufacture or
use of engineered nanoparticles. Attendees will learn
about the latest size and surface area measurement
techniques and their applications as well as hearing
about the measurement needs and requirements of manufacturers
and users of engineered nanoparticles. Ample opportunity
will be provided for interaction between attendees
during the presentations and the refreshment breaks.
Attendance at this conference
is FREE.
Vist the website http://www.npl.co.uk/metrology_clubs/mnt/
for programme and registration details.
Organiser: National
Physical Laboratory
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